There are several modules that enable direct or indirect editing of the SPM data. In principal, most of the data processing modules change the data in one way or another. However, in this section we would like to describe the modules and tools that are specifically designed to correct local defects in an image. The functions below remove “bad” data from an image, and then fill it in using an interpolation algorithm.
Profiles taken in the fast scanning axis (usually x-axis) can be mutually shifted by some amount or have slightly different slopes. The basic line correction function → → deals with this type of discrepancy using several different correction algorithms:
Similarly as in the two-dimensional polynomial levelling, the background, i.e. values subtracted from individual rows can be extracted to another image. Or plotted in a graph since the value is the same for the entire row.
The line correction function support masking, allowing the exclusion of large features that could distract the corection algorithms. The masking options are offered only if a mask is present though. Note the Path level tools described below offers a different method of choosing the image parts important for alignment. It can be more convenient in some cases.
Functionattempts to deal with shifts that may occur in the middle of a scan line. It tries to identify misaligned segments within the rows and correct the height of each such segment individually. Therefore it is often able to correct data with discontinuities in the middle of a row. This function is somewhat experimental and the exact way it works can be subject to futher changes.
The Remove Spots tool can be used for removing very small parts of the image that are considered a scanning error, dust particle or anything else that should not be present in the data. Note that doing so can dramatically alter the resulting statistical parameters of the surface, so be sure not to remove things that are really present on the surface.
While using this tool you can pick up position of the spot to magnify its neighbourhood in the tool window. Then, in the tool window, select a rectangle around the area that should be removed. You can then select one of several interpolation methods for creating data in place of the former “spot”:
Clickingwill execute the selected algorithm.
The simple Remove Grains tool removes manually selected connected parts of mask or interpolates the data under them, or possibly both. The part of mask to remove is selected by clicking on it with left mouse button.
Scars (or stripes, strokes) are parts of the image that are corrupted by a very common scanning error: local fault of the closed loop. Line defects are usually parallel to the fast scanning axis in the image. This function will automatically find and remove these scars, using neighbourhood lines to “fill-in” the gaps. The method is run with the last settings used in Mark Scars.
Mark Scars module can create a mask
of the points treated as scars. Unlike
which directly interpolates the located defects, this module lets you
interactively set several parameters which can fine-tune the scar
After clickingthe new scar mask will be applied to the image. Other modules or tools can then be run to edit this data.
This function substitutes the data under the mask by the solution of solving the Laplacian equation. The data values around the masked areas define the boundary conditions. The solution is calculated iteratively and it can take some time to converge.
The Fractal Correction module, like the Remove Data Under Mask module, replaces data under the mask. However, it uses a different algorithm to come up with the new data: The fractal dimension of the whole image is first computed, and then the areas under the mask are substituted by a randomly rough surface having the same fractal dimension. The root mean square value of the height irregularities (roughness) is not changed by using this module.
This module creates mask of areas in the data that not pass the 3σ criterion. All the values above and below this confidence interval are marked in mask and can be edited or processed by other modules afterwards, for instance Remove Data Under Mask. This outlier marking method is useful for global outliers with values very far from the rest of the data.
Local outliers are values that stick out from their neighbourhood. Functionmarks data that do not seem to belong in the distribution of surrounding values.
The outlier type to mark can be selected as Positive, Negative or Both for values much larger than their neighbours, much smaller and both types simultaneously, respectively. Note that selecting Both can mark different areas than if positive and negative outliers were marked separately and the results combined.
The marking proceeds by subtracting a local background from the image and then marking global outliers in the resulting flattened image. Specifically, the local background is obtained by an opening (minimum), closing (maximum) or a median filter of given radius. The radius of the filter is controlled with Defect radius. It determines the maximum size of defect that can be found and marked. However, it is often useful to use larger radius than the actual maximum defect size.
Defect marking sensitivity is controlled with option Threshold. Smaller values mean more conservative marking, i.e. less values marked as outliers. Larger value means more values marked as outliers.
The Path Leveling tool can be used to correct the heights in an arbitrary subset of rows in complicated images.
First, one selects a number of straight lines on the data. The intersections of these lines with the rows then form a set of points in each row that is used for leveling. The rows are moved up or down to minimize the difference between the heights of the points of adjacent rows. Rows that are not intersected by any line are not moved (relatively to neighbouring rows).
Unrotate can automatically make principal directions in an image parallel with horizontal and/or vertical image edges. For that to work, the data need to have some principal directions, therefore it is most useful for scans of artifical and possibly crystalline structures.
The rotation necessary to straighten the image – displayed as Correction – is calculated from peaks in angular slope distribution assuming a prevalent type of structure, or symmetry. The symmetry can be estimated automatically too, but it is possible to select a particular symmetry type manually and let the module calculate only corresponding rotation correction. Note if you assume a structure type that does not match the actual structure, the calculated rotation is rarely meaningful.
It is recommended to level (or facet-level) the data first as overall slope can skew the calculated rotations.
The assumed structure type can be set with Assume selector. Following choices are possible:
Automatically detected symmetry type, displayed above as Detected.
Parallel lines, one prevalent direction.
Triangular symmetry, three prevalent directions (unilateral) by 120 degrees.
Square symmetry, two prevalent directions oriented approximately along image sides.
Rhombic symmetry, two prevalent directions oriented approximately along diagonals. The only difference from Square is the preferred diagonal orientation (as opposed to parallel with sides).
Hexagonal symmetry, three prevalent directions (bilateral) by 120 degrees.