This guide is a work in progress.
Copyright © 2004–2007, 2009–2023 Petr Klapetek, David Nečas, Christopher Anderson
Permission is granted to copy, distribute and/or modify this document under the terms of either
The GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License.
The GNU General Public License, Version 2 or any later version published by the Free Software Foundation. A copy of the license is included in the section entitled GNU General Public License.
Table of Contents
- 1. Introduction
- 2. Installation
- 3. Getting Started
- 4. Data Processing and Analysis
- Basic Operations
- Interpolation
- Data Levelling and Background Subtraction
- Masks
- Filters
- Presentations
- Scan Line Artefacts
- Local Defects
- Global Distortions
- Statistical Analysis
- One-Dimensional Roughness Parameters
- Feature Measurement
- Grain Analysis
- Fourier Transform
- Wavelet Transform
- Fractal Analysis
- Tip Convolution Artefacts
- Force and Indentation
- Convolution and deconvolution
- Multiple Data
- Magnetic force microscopy
- Scanning Microwave Microscopy
- Graph Processing
- Volume Data Processing
- Volume Data Processing: Image stacks
- XYZ Data Processing
- Curve Maps Data Processing
- Force Distance Curve Maps
- Synthetic Surfaces
- Calibration and uncertainties
- Python Scripting
- Plug-ins
- 5. Summaries and Tables
- gwyddion — SPM data visualization and analysis
- gwyddion-thumbnailer — Creates thumbnails of SPM data files
- Keyboard Shortcuts
- Supported File Formats
- High-Depth Image Formats
- Expressions
- Fitting Functions
- Fitting 3D Shapes
- Resources
- Settings
- Toolbox Configuration
- Format of Gwyddion Files
- Simple Field Files
- Simple XYZ Files
- 6. Building from Source Code and Development
- A. GNU General Public License
- B. GNU Free Documentation License
- Index